HEF4017BP DATASHEET PDF

It sounds as though your specific IC may be damaged. I guess the polarity of the Datasheef at Q2 is wrong. Post as a guest Name. Is Q2 the only one out of place? Kris Bahnsen Only Q2 seems problematic. Home Questions Tags Users Unanswered.

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Kijar Static characteristics Table 6. Applications — Applications that are described hefbt for any of these products are for illustrative purposes only. Ordering information Table 1. Recommended operating conditions Table 5. This document supersedes and replaces all information supplied prior to the publication hereof. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice.

NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product vatasheet reasonably be expected to result in personal injury, death or severe property or environmental damage.

Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. All referenced brands, product names, service names and trademarks are the hegbt of their respective owners.

HEFBT Datasheet However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. IEE logic symbol 6. The latest product status information is available on the Internet at URL http: Schmitt trigger action makes the clock inputs highly tolerant of slower rise and fall times.

No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Limiting values — Stress above one or more limiting values as defined in the Absolute Maximum Ratings System of IEC may cause permanent damage to the device.

Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number s and title. For more information, please visit: For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office.

Revision history Table Measurement points given in Table 9. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. Exposure to limiting values for extended periods dtasheet affect device reliability. Limiting values Table 4. Automatic counter code correction is provided by an internal circuit: Preliminary [short] data sheet Qualification This document contains data from the preliminary specification.

NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. When cascading counters, the Q output, which is LOW while the counter is in states 5, 6, 7, 8, and 9, can be used to drive the CP0 input of the next counter. Rename the pins throughout to be consistent with rest of HEF family.

Definitions for test circuit: Plastic or metal protrusions of 0. Dynamic characteristics Table 7. Functional description Table 3. Dynamic power dissipation PD PD can be calculated from the formulas shown. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http: Test circuit Table Contact information For more information, please visit: The content is still under internal review and subject to formal approval, which may result in modifications or additions.

In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. Package SOT74 removed from Section 4.

In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Related Posts

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